Descripción

For mixed-signal DUT testing
Key Facts
  • 16-channel analog and digital signal acquisition
  • High measurement resolution of 24 bits for level ranges up to ±27 V
  • Sampling rate of up to 5 ksample/s for inputs
  • Arbitrary waveform and digital output pattern stored by two 5000-sample on-board memory sections
  • Autocorrection feature for all input and output channels
  • Analog measurement bus access to eight bus lines
  • Trigger options via PXI trigger bus and trigger lines via front connector
  • 16-channel analog and digital stimulus outputs, offering static and dynamic signal outputs
  • 16-bit resolution and high output level of up to ±27 V
  • Update rate of up to 5 ksample/s for outputs
  • Squarewave output and programmable duty cycle for digital stimulation
  • Four output channels providing up to 100 mA of applied current, including programmable limitation
  • Twelve output channels for driving up to 15 mA output currents
  • Analog and digital input data stored by two 5000-sample on-board memory sections
  • Versatile signal switching and DUT interconnection
  • Stimulus and acquisition channels providing floating operation
  • Selftest of all inputs, outputs and relays via analog measurement bus and R&S®TS-PSAM
  • Soft front panel support for immediate deployment
  • LabWindows/CVI device driver support
  • Generic test software library (GTSL) in DLL format

Brief Description The R&S®TS-PIO2 analog and digital I/O module is a 16-channel stimulus and a 16-channel parametric measurement unit for versatile DUT testing. It is part of the R&S®TSVP modular test and measurement platform and makes full use of the common analog measurement bus and the standardized isolated frontend technology. The required floating R&S®TS-PDC rear I/O DC supply module is included in the R&S®TS-PIO2. The unit can be used for the R&S®TS?PCA3 (R&S®CompactTSVP) and for the R&S®TS?PWA3 (R&S®PowerTSVP). The R&S®TS-PIO2 is a CAN-bus-controlled module, which takes up only one slot inside an R&S®TSVP chassis. The module can be used as a flexible stimulus and parametric measurement unit for a wide range of applications in research and development of electronic circuitry.
Specifications
Application in R&S®TSVP platform R&S®CompactTSVP or R&S®PowerTSVP 1 slot required, front and rear
Interface
Control bus CAN 2.0b (1 Mbit/s)
DUT connector (front) DIN41612, 96 pins
Rear I/O connector CompactPCI connector J2, 110 pins
Accuracy
Uncertainties of specified values apply under the following conditions:
Autocorrection The module’s firmware and driver software monitor temperature and time and request execution of the module’s autocorrection feature after 24 h or a temperature drift > ±5 °C.
Condition of specified accuracy The specified accuracy is applicable during a valid autocorrection period and in an ambient temperature range from +18 °C to +28 °C.
Additional error due to temperature coefficient ±(0.1 ? uncertainty)/°C for a valid autocorrection period and in ambient temperature ranges from +5 °C to +18 °C and from +28 °C to +40 °C
Warm-up time 1 h
Output stage
Output channels 16
Group standard channels extended channels
A 1, 2, 3 4
B 5, 6, 7 8
C 9, 10, 11 12
D 13, 14, 15 16
Output current per module max. 300 mA, summation of all outputs
Standard output channels 12
standard current max. 15 mA, per channel
voltage range ±27 V
voltage resolution 14 bits
voltage uncertainty (load > 100 k?) ±(0.1 % + 27 mV), with autocorrection, ±(0.1 % + 40 mV), with fast autocorrection, additional error of 150 ?V per mA of current in common AGND path
rise time/fall time typ. 4.5 ?s, (5 % to 95 % of –27 V to +27 V transition)
Extended output channels 4
extended output current max. 100 mA per channel
extended voltage range ±27 V
voltage resolution 14 bits
voltage uncertainty (external sensing) ±(0.05 % + 13.5 mV) with autocorrection, ±(0.05 % + 20 mV) with fast autocorrection
current limit 0.5 mA to 100 mA, programmable
current resolution 14 bits
current uncertainty ±(0.3 % + 300 ?A + common mode error), common mode error = 20 ?A/V of output voltage
rise/fall time typ. 36 ?s (5 % to 95 % of –27 V to +27 V transition)
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