Descripción

Key Facts
  • Phase noise is an important parameter in wireless communications systems. The R&S®FSV-K40 option enables the R&S®FSV and R&S®FSVA to perform fast and easy phase noise measurements in development and production. Equipped with the R&S®FSV-K40 option, the R&S®FSV and R&S®FSVA can measure the single sideband phase noise across a selectable carrier offset frequency range with logarithmic display of the offset range. Based on the measured phase noise, the user can also determine the residual FM/PM and the jitter.
  • Phase noise measurement
    • Carrier offset frequency range selectable from 1 Hz to 1 GHz in 1/3/10 sequence (1 Hz, 3 Hz, 10 Hz, 30 Hz, etc.)
    • Number of averages, sweep mode and filter bandwidth for every measurement subrange can be individually selected to optimize the measurement speed
    • Fast results for the subranges are obtained by starting the measurement at the maximum carrier offset
    • Verification of carrier frequency and power prior to each measurement avoids incorrect measurements
    • Improvement of dynamic range by measuring the inherent thermal noise in a reference trace and performing noise correction
  • Measurement of residual FM/PM and jitter
    • Integration across the entire selected carrier offset frequency range or across a separately selectable frequency range
    • Tabular display of residual FM, residual PM and RMS jitter in addition to measurement trace
  • Evaluation aids
    • Limit lines with PASS/FAIL indication
    • Spot phase noise at up to four selectable frequency offsets
    • Maximum of four additional markers

''